1 - "Elastic scattering of 412,468 and 662 keV gamma rays" Barros, O.D.Gonçalves, M.Gaspar, J.R.Moreira, Phys.Rev. C22, (1980) 332.

 2 -"Experiments on Rayleigh Scattering of 145 keV and 317 keV Photons" S. de Barros, J.Eichler, O.D.Gonçalves e M. Gaspar, Z. Naturforsch, 36a, 595 (1981)

 3 -"Rayleigh Scattering of 468 keV Photons by Different Atoms" S. de Barros, J.Eichler, M.Gaspar e O.D.Gonçalves, Physical Review C24, 1765 (1981)

 4 -"Comparison of Compton and Rayleigh Scattering at 145 keV" J.Eichler, S. de Barros, O.D.Gonçalves, M.Gaspar, Phys. Rev. C28, 3656 (1983)

 5 -"Compton Scattering of 662 keV gamma-rays by Various Atoms" O.D.Gonçalves, M.Gaspar, Barros, J.Eichler, Phys. Rev. A 30-3, 1509 (1984)

6 -"Coherent scattering of 59.54 keV Gamma-rays by Al, Cu, Zn and Pb" O.D.Gonçalves, M.Gaspar, Barros, J.Eichler,Phys. Rev. A 32 (1985)

7 -"Elastic Scattering of 662 keV gamma-Ray on Atoms" O.D.Gonçalves, S. de Barros, M.Gaspar e J.Eichler, Z. Phys. D1, 167 (1986)

8 -"Some Experiments on gamma-scattering between 122 and 145 keV at Small Angles" M.Gaspar, O.D.Gonçalves, S. de Barros e J.Eichler, Z.Phys. D1, 287 (1986).

9 -"Gamma-Ray Diffraction Studies of the Perfection of Large Silicon Single Crystals" J.R.Schneider, H.A. Graf e O.D.Gonçalves, J. of Cryst. Growth 80 (1987) 225.

10 -"On the treatment of primary extinction in diffraction theories based on intensity coupling" J.R.Schneider, O.D.Gonçalves e H.A.Graf, Acta Cryst. A44 (1988) 461.

11 -"Annealed Czochralski grown silicon crystals: A new material for the monochromatization of synchrotron radiation and X-rays above 60keV", J.R.Schneider, O.D.Gonçalves, A.J.Rollanson et al", N.Inst.Meth.B29 (1988) 661.

12 -"Effects of Bragg reflection on Rayleigh Scattering Experiments on polycrystalline targets" J. Eichler, O.D.Gonçalves e S. de Barros, Phys.Rev.A37 (1988) 3702.

13 -"Comparison Between Measurements on Rayleigh Scattering and Form Factors Theories" O.D.Gonçalves, Barros and J.Eichler - Nucl. Instr. Meth. A280, 375 (1989)

14 -"Investigation of holographic AgBr films, optical density, Ag-concentration and refraction index" J.Eichler, S.D.Magalhães, O.D.Gonçalves, P.Rizzo and G.Ackermann, submitted to Optical Engeneering.

15 -"Rayleigh scattering from crystals and amorphous structures" O.D.Gonçalves, W.M.S.Santos, J.Eichler and A.M.Borges, Phys.Rev.A 49, vol 6 (1993).

16 -"Solid state effects on Rayleigh scattering experiments. Limits for the free-atom approximation" O.D.Gonçalves, C.Cusatis and I.Mazzaro, Phys.Rev.A 48, vol 1 (1994).

17 - "Calculation of X-ray Scattering of 17.4 keV Radiation and Image Degradation in Mammography" S.D. Magalhães, J. Eichler e O.D. Gonçalves, Nucl. Instr. And Meth. In Physics Research B95 (1995)87-90.

18- "Investigation of Holographic AgBr-films: optical density, Ag- concentration, and index of refraction" S.D. Magalhães, J. Eichler, G.K. Ackermann, O.D.Gonçalves, P.Rizzo - aceito por Optics and Laser Technology. 27-3 (1995) 195-197.

19- "Scattering of photons and influence in diagnostic radiology." S.D.Magalhães, J.Eichler, O.D.Gonçalves and P.Rizzo, Applied Radiation and Isotopes 46-6/7(1995) 647-648

20- "Evaluation of the Uncertainty in Scattering Experiments: I- Averaging cross sections"S.D.Magalhães, O.D.Gonçalves and H. Schechter, Applied Radiation and Isotopes 46-6/7(1995) 453-454

21- "Calculation of X-ray Scattering of 17.4 keV Radiation and Image Degradation in Mammography" S.D. Magalhães, J. Eichler e O. Gonçalves, Nucl. Instr. And Meth. in Physics Research B95 (1995) 87-90.

22- "Scattering of 60 keV Photons by Biological Material and Influence in Diagnostic Radiology" S.D. Magalhães, J. Eichler, O. D. Gonçalves, P.Rizzo - Med. Phys. 23(9) (1996).

23 - A Method to Measure the Pressure Profile Inside Evacuated Tubes with High Voltage Electrodes J.C. Acquadro, N.Gonçalves, H.Luna, R.Donangelo, Castro Faria, O.D.Gonçalves, G.Jalbert, L.F.S.Coelho. Nucl.Instr.Meth. A-398 (1997) 162-166.

24- Measurements of secondary to primary ratio of 60 keV photons in water phantoms, O.D.Gonçalves, J.Eichler, H.Schechter, H.J.Schulz and S.D.Magalhães. Rad. Phys. and Chem 51-(4) (1998) - 605-606.

25- Material Analysis Based on Fluorescence induced by gamma rays; O.D.Gonçalves, F.L.Custódio and J.Eichler, Rad. Phys. and Chem. - 51-(4) (1998) - 675-676.

26- Study of secondary x-rays from radiographic intensifying screens, R.C.Barroso, O.D.Gonçalves, J.Eichler, R.T.Lopes and S.C.Cardoso, Nucl.Inst.Meth - A404 (1998) 407-412.

27- X-ray diffraction tomography using interference effects, R.C.Barroso, R.T.Lopes, O.D.Gonçalves, Assis, Aceito para publicação em Nucl.Inst.Meth 1998.